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Vacuum Probe Station with Keithley 4200-scs semiconductor parameter analyzer

Ultrawide wavelength range opto-electrical probe station

Raman/PL spectroscopy with photocurrent mapping system

 

 

 

 

E-beam evaporator

 

 

 

 

 

 

 

 

Mask aligner

Reactive ion etcher

Atomic Layer Deposition (Thermal)

 

Artificial synapse characteristics measurement unit

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